Study of the [(Co45Fe45Zr10)x(Al2O3)100−x/a-Si:H]m multilayer nanostructure by polarized neutron reflectometry |
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Authors: | EA Dyadkina SV GrigorievD Lott AV SitnikovYE Kalinin |
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Institution: | a Petersburg Nuclear Physics Institute, Gatchina, St. Petersburg 188300, Russia b GKSS-Forschungszentrum, Geesthacht 21502, Germany c Voronezh State Technical University, Voronezh 394026, Russia |
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Abstract: | Polarized neutron reflectometry was used to investigate the amorphous multilayer nanostructures (Co45Fe45Zr10)x(Al2O3)100−x/a-Si:H]m, whose magnetic properties are dependent on the concentration of the magnetic constituent (x=34, 47 and 60 at%) as well as on the thicknesses of the metal-dielectric (Co45Fe45Zr10)x(Al2O3)100−x and semiconductor a-Si:H layers. The average magnetization of the individual magnetic layer is found to be inhomogeneous with the magnetically active central part and two magnetically dead parts at the interfaces. |
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Keywords: | Polarized neutron reflectometry Multilayer nanostructure Magnetization of an individual magnetic layer |
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