| 紫外光对MCP增益特性测量的影响 |
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| 引用本文： | 卢耀华,李野.紫外光对MCP增益特性测量的影响[J].应用光学,1994,15(2):21-23. |
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| 作者姓名： | 卢耀华 李野 |
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| 作者单位： | 长春光学精密机械学院 |
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| 摘 要： | 介绍用ＵＶ光电法测量ＭＣＰ电子增益时，ＵＶ透过金薄膜的附加输出给测量带来的影响，给出了实验结果并进行初步分析，最后指出确保增益测量结果可靠性的途径。
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| 关 键 词： | 微道道板 电子增益 紫外光 |
THE EFFECT OF ULTRAVIOLET ON THE MEASUREMENT OF MCP GAIN CHARACTERISTIC |
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| Lu Yaohua, Li Ye, Wu Kui, Jiang Delong, Fu Lichen.THE EFFECT OF ULTRAVIOLET ON THE MEASUREMENT OF MCP GAIN CHARACTERISTIC[J].Journal of Applied Optics,1994,15(2):21-23. |
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| Authors: | Lu Yaohua Li Ye Wu Kui Jiang Delong Fu Lichen |
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| Institution: | Changchun College of Optics and Fine Mechanics |
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| Abstract: | The effect of additional output of UV trans mitting through metal thin film on the measurement of MCP electronic gain with UV photoelectric method is described and the experimental result is given and a preliminary analysis is carried out. Finally, an approach to guarantee the reliability of gain measurement result is indicated. |
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| Keywords: | MCP electronic gain UV |
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