首页 | 本学科首页   官方微博 | 高级检索  
     检索      

基于对焦深度法的光学显微镜系统设计
引用本文:陈健,王灵阳,陈德全,张茂林.基于对焦深度法的光学显微镜系统设计[J].应用光学,2017,38(6):979-984.
作者姓名:陈健  王灵阳  陈德全  张茂林
作者单位:1.福建工程学院 福建省数字化装备重点实验室,福建 福州 350118
基金项目:福建省数控装备技术重大研发平台2014H2002福建省教育厅科技项目JK2015031福建工程学院科研项目GY-Z160038
摘    要:针对传统显微镜采用手工对焦方式存在自动化程度低、对焦过程较慢且对操作者经验要求高的问题,提出一套基于对焦深度法的光学显微镜系统。结合基于图像处理自动对焦的显微镜通用结构,设计了一套由ARM开发板、触控液晶显示屏、Arduino UNO开发板、红外对管、工业数码显微镜及步进电机等组成的光学显微镜系统。结合触控液晶显示屏的特点,设计出结合不同大小的感兴趣区域对焦窗口选择方法,并在采用常见梯度函数作为图像清晰度评价函数及爬山搜索算法的基础上,提出容错改进方法。实验分别对不同的图像清晰度评价函数及对焦窗口大小进行了实时性、灵敏度及容错性能测试。结果表明,该系统具有较高的可靠性。

关 键 词:显微镜    对焦深度法    ARM开发板    自动对焦
收稿时间:2017-05-22

Design of microscope system based on depth from focus
Institution:1.Fujian Provincial Key Laboratory of Digital Equipment, Fujian University of Technology, Fuzhou 350118, China2.School of Information Science and Engineering, Fujian University of Technology, Fuzhou 350118, China3.Straits College of Engineering, Fujian University of Technology, Fuzhou 350118, China
Abstract:According to the problems of low degree of automation, slow process of focusing and high requirement of operator experience caused by traditional manual focusing microscope, a new optical microscope system based on depth from focus was proposed. Firstly, according to the general microscope structure with auto-focusing based on image processing, a set of microscope system was designed, constituted of ARM development board, touch-sensitive LCD, Arduino UNO development board, infrared tube, industrial digital microscope and stepping motor, etc. Then, a focusing window selection method combining regions of interest with different sizes was proposed based on the characteristics of touch-sensitive LCD screen.And an improved method with fault tolerant was put forward based on the mountain climb searching algorithm and the common gradient function as the image definition evaluation function. Furthermore, the real-time, sensitivity and fault-tolerant performance for different image definition evaluation functions and sizes for selection window were tested in the experiment.The results show that the system has high reliability.
Keywords:
本文献已被 CNKI 等数据库收录!
点击此处可从《应用光学》浏览原始摘要信息
点击此处可从《应用光学》下载免费的PDF全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号