超导低电阻接头衰减法测试过程中的拟合偏差控制

超导技术在许多高新技术领域有着广泛而深远的应用前景,其中超导导体接头技术是超导发展过程中必不可少的关键环节之一,快速而又准确地评估低电阻接头显得尤为重要.本文在考虑超导体的E-J特性后,针对目前低电阻接头采用的衰减法测量,计算得出感应电流完整的衰减曲线方程-幂函数方程.对比目前广泛采用的指数方程拟合与采用幂函数方程拟合的偏差,指出采用指数方程代替幂函数方程拟合的必要条件,为接头电阻衰减法测试,尤其是低电阻接头情况下的测量提供参考.

Control of Fit Deviation During Superconducting Low Resistance Joint Attenuation Testing

Superconducting technology has a wide and far-reaching application prospect in many high-tech fields, among which the superconducting conductor joint technology is one of the essential key links in the development of superconductivity. It is particularly important to evaluate the low resistance joint quickly and accurately. In this paper, after considering the characteristics of superconductor, a complete attenuation curve equation of induced current-power function equation is calculated according to the current attenuation method of low resistance joint. By comparing the deviation between exponential equation fitting widely used at present and power function equation fitting, the necessary conditions of exponential equation fitting instead of power function equation fitting are pointed out, which can provide reference for the test of joint resistance attenuation method9 especially the measurement of low resistance joint.