首页 | 本学科首页   官方微博 | 高级检索  
     检索      

子孔径拼接技术在长平晶计量中的应用研究
引用本文:何勇,王青,尚博,陈磊,朱日宏.子孔径拼接技术在长平晶计量中的应用研究[J].光学技术,2006,32(Z1).
作者姓名:何勇  王青  尚博  陈磊  朱日宏
摘    要:研究子孔径拼接在长平晶测试中的应用。讨论了子孔径拼接的基本原理,建立了子孔径拼接模型,确定了进行长平晶拼接测试的基本算法。根据最小二乘法的基本原理,编制了子孔径拼接数据处理程序,通过使用该程序,可以有效地修正测试过程中产生的倾斜量。进行了长平晶拼接检测实验,拼接结果与全孔径检测结果进行了比较,结果表明,该程序能够满足长平晶的检测要求。

关 键 词:子孔径拼接  长平晶  计量  图像处理

The application research of sub-aperture stitching in long optical flat testing
HE Yong,WANG Qing,SHANG Bo,CHEN Lei,ZHU Ri-hong.The application research of sub-aperture stitching in long optical flat testing[J].Optical Technique,2006,32(Z1).
Authors:HE Yong  WANG Qing  SHANG Bo  CHEN Lei  ZHU Ri-hong
Abstract:The application of sub-aperture stitching in long optical flat was researched.The principle was discussed.Testing the model of sub-aperture stitching were established.According to the basic theory of least-squ,a program was designed for it.The tilting can be revised by using this program.Experiments were done to verify the feasibility and the validity of this program.After the anti-tilting the right stitching result can be gotten and it is possible to compare different test results with full-aperture.The result expressed that the program can satisfy the request of long optical flat testing.
Keywords:sub-aperture stitching  long optical flat  measurement  image processing
本文献已被 万方数据 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号