扇束X射线ICT偏置扫描方式及其重构算法

对于较大尺寸构件ICT检测,为了避免采用费时的二代扫描,讨论了一种基于三代扫描的偏置扫描方式,推导了它的FBP重构算法。计算机模拟和实验结果证明了该算法的正确性。分析表明,在射线有效扇束角和探测器长度、位置不变的情况下,它的有效扫描视野在三代扫描的1.9倍以上。

Bias scan mode for fan-beam X-ray ICT and its reconstruction algorithm

In order to avoid adopting the generation II scan mode taking much time for the ICT testing of large components, a new scan mode based generation III scan mode called bias scan was discussed and its reconstruction algorithm based on FBP was deduced. The validity of the algorithm was verified by the results of computer simulation and experiments. Analysis showed that the effective scan field of view can be improved more than 90% comparing with that of the generation III with the invariability of the position and length of the detector.