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TEM纳米云纹法测量纳米碳管变形
引用本文:尚海霞,谢惠民,朱宏伟,戴福隆,刘战伟,吴德海.TEM纳米云纹法测量纳米碳管变形[J].光学技术,2003,29(5):515-517.
作者姓名:尚海霞  谢惠民  朱宏伟  戴福隆  刘战伟  吴德海
作者单位:1. 清华大学,工程力学系,北京,100084
2. 清华大学,机械工程系,北京,100084
基金项目:国家自然科学基金(10232030),国家教委回国人员起动基金(02010261)
摘    要:提出了透射电子显微镜(TEM)纳米云纹法的新技术,首次将该方法用于单根单壁碳纳米管的残余变形测量。纳米云纹由计算机显示器扫描线与碳纳米管束TEM图像干涉而成。该方法具有纳米级空间分辨率,可直接测量碳纳米管的力学性能。对TEM纳米云纹法的原理进行了详细的阐述,并利用不同管径的单壁碳管束产生了云纹。对直径为7.5nm的弯曲碳管束的残余变形进行测量,直接得到了其中一根直径为1.0nm的单壁碳管的残余变形场。实验结果证明了该方法的可行性。该方法为纳米尺度的碳管力学性能测量提供了新途径。

关 键 词:TEM纳米云纹法  单壁碳纳米管束  径向力学性能  残余变形
文章编号:1002-1582(2003)05-0515-03
修稿时间:2003年2月20日

Deformation measurement of nanotubes by tem nano-moiré method
SHANG Hai-xia ,XIE Hui-min ,ZHU Hong-wei ,DAI Fu-long ,LIU Zh an-wei ,WU De-hai.Deformation measurement of nanotubes by tem nano-moiré method[J].Optical Technique,2003,29(5):515-517.
Authors:SHANG Hai-xia  XIE Hui-min  ZHU Hong-wei  DAI Fu-long  LIU Zh an-wei  WU De-hai
Institution:SHANG Hai-xia 1,XIE Hui-min 1,ZHU Hong-wei 2,DAI Fu-long 1,LIU Zh an-wei 1,WU De-hai 2
Abstract:The TEM nano-moiré method is first applied to measure the mechanical properties of single-walled nanotubes. The nano-moiré method is a newly deve lo ped experimental technique, which allows direct measurement to nanoscopic mechan ical parameters. The moiré pattern is generated by the interference between sca nning lines in monitor and transmission electron microscopy (TEM) image of self - assembled SWNTs bundles. The principle of the technique is described in detail. The SWNT bundles with different diameters produced by arc-discharge method are u sed to generate moiré patterns. The TEM nano-moiré method is successfully use d to measure the residual deformation of an individual nanotube with diameter of 1.0nm in a curved SWNT bundle. The results demonstrate the feasibility of this t echnique.
Keywords:SWNTs  TEM nano-moiré method  mechanical properties  residual deformationon
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