首页 | 本学科首页   官方微博 | 高级检索  
     检索      

等离子体辅助沉积HfO_2/SiO_2减反、高反光学薄膜
引用本文:付雄鹰,孔明东,马平,邱服民,马道远,柴林,胡建平,李瑞洁.等离子体辅助沉积HfO_2/SiO_2减反、高反光学薄膜[J].光学技术,1998(3).
作者姓名:付雄鹰  孔明东  马平  邱服民  马道远  柴林  胡建平  李瑞洁
作者单位:成都精密光学工程研究中心
摘    要:本文报导了用等离子体辅助(Plasma-IAD)沉积技术沉积HfO2/SiO2减反及高反光学薄膜。在波长1064nm处,HfO2/SiO2减反膜透过率大于99.5%,HfO2/SiO2高反膜反射率大于99.5%。

关 键 词:等离子体辅助沉积,HfO_2/SiO_2,减反膜,高反膜

Deposition of HfO 2/SiO 2 antireflective and high reflective optical thin film by plasma IAD
Fu Xiongying,Kong Mingdong,Ma Ping,Qiu Fuming,Ma Daoyuan,Chai Lin,Hu Jianping.Deposition of HfO 2/SiO 2 antireflective and high reflective optical thin film by plasma IAD[J].Optical Technique,1998(3).
Authors:Fu Xiongying  Kong Mingdong  Ma Ping  Qiu Fuming  Ma Daoyuan  Chai Lin  Hu Jianping
Abstract:The plasma ion assisted deposition (plasma IAD) process was applied in deposition of optical thin film which was made by alternately deposition of HfO 2 and SiO 2.At the wavelength λ=1064nm, transimittance of HfO 2/SiO 2 antireflective thin film is more than 99.5%, and the reflectivity of HfO 2/SiO 2 high reflective thin film is more than 99.5%.
Keywords:plasma  ion assisted deposition  HfO  2/SiO  2  antireflective thin film  high reflective thin film    
本文献已被 CNKI 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号