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反射式飞行时间质谱仪结合纳升电喷雾电离源研究金属簇合物
引用本文:吴小虎,谢华,刘志凌,苏海峰,林水潮,唐紫超.反射式飞行时间质谱仪结合纳升电喷雾电离源研究金属簇合物[J].化学物理学报,2016,29(4):401-406.
作者姓名:吴小虎  谢华  刘志凌  苏海峰  林水潮  唐紫超
作者单位:中国科学院大连化学物理研究所, 分子反应动力学国家重点实验室, 大连 116023,中国科学院大连化学物理研究所, 分子反应动力学国家重点实验室, 大连 116023,山西师范大学化学与材料科学学院, 太原 041004,厦门大学固体表面物理化学国家重点实验室, 厦门 361005,厦门大学固体表面物理化学国家重点实验室, 厦门 361005,中国科学院大连化学物理研究所, 分子反应动力学国家重点实验室, 大连 116023;厦门大学固体表面物理化学国家重点实验室, 厦门 361005
基金项目:We thank Professor Quan-ming Wang for providing the metal cluster compounds samples. This work was supported by the National Natural Science Foundation of China (No.21103186, No.21273233, and NO.21227001), the Ministry of Science and Technology of China, and the Chinese Academy of Sciences.
摘    要:An experiment facility has been set up for the study of metal cluster compounds in our laboratory, which consists of a nano-electrospray ionization source, an ion transmission and focus system, and a reflectron time-of-flight mass spectrometer. Taking advantage of the nano-electrospray ionization source, polyvalent ions are usually produced in the “ionization” process and the obtained mass resolution of the equipment is over 8000. The molecular ion peaks of metal cluster compounds Au20(PPhpy2)10Cl2](SbF6)4, where PPhpy2=bis(2-pyridyl)phenylphosphine, and Au6Ag2(C)L6](BF4)4, where L=2-(diphenylphosphino)-5-methylpyridine, are distinguished in the respective mass spectrum, accompanied by some fragment ion peaks. In addition, the mass-to-charge ratios of the parent ions are determi-nated. Preliminary results suggest that the device is a powerful tool for the study of metal cluster compounds. It turns out that the information obtained by the instrumentation serves as an essential supplement to single crystal X-ray diffraction for structure characterization of metal cluster compounds.

关 键 词:纳升电喷雾电离源  离子传输与聚焦系统  反射式飞行时间质谱仪  金属簇合物  单晶X射线衍射
收稿时间:2016/1/26 0:00:00
修稿时间:3/1/2016 12:00:00 AM

A Reflectron Time-of-Flight Mass Spectrometer with a Nano-Electrospray Ionization Source for Study of Metal Cluster Compounds
Xiao-hu Wu,Hua Xie,Zhi-ling Liu,Hai-feng Su,Shui-chao Lin and Zi-chao Tang.A Reflectron Time-of-Flight Mass Spectrometer with a Nano-Electrospray Ionization Source for Study of Metal Cluster Compounds[J].Chinese Journal of Chemical Physics,2016,29(4):401-406.
Authors:Xiao-hu Wu  Hua Xie  Zhi-ling Liu  Hai-feng Su  Shui-chao Lin and Zi-chao Tang
Institution:State Key Laboratory of Molecular Reaction Dynamics, Dalian Institute of Chemical Physics, Chinese Academy of Sciences, Dalian 116023, China,State Key Laboratory of Molecular Reaction Dynamics, Dalian Institute of Chemical Physics, Chinese Academy of Sciences, Dalian 116023, China,School of Chemistry & Material Science, Shanxi Normal University, Linfen 041004, China,State Key Laboratory for Physical Chemistry of Solid Surfaces, Collaborative Innovation Center of Chemistry for Energy Materials, and Department of Chemistry, College of Chemistry and Chemical Engineering, Xiamen University, Xiamen 361005, China,State Key Laboratory for Physical Chemistry of Solid Surfaces, Collaborative Innovation Center of Chemistry for Energy Materials, and Department of Chemistry, College of Chemistry and Chemical Engineering, Xiamen University, Xiamen 361005, China and State Key Laboratory of Molecular Reaction Dynamics, Dalian Institute of Chemical Physics, Chinese Academy of Sciences, Dalian 116023, China;State Key Laboratory for Physical Chemistry of Solid Surfaces, Collaborative Innovation Center of Chemistry for Energy Materials, and Department of Chemistry, College of Chemistry and Chemical Engineering, Xiamen University, Xiamen 361005, China
Abstract:
Keywords:Nano-electrospray ionization source  Ion transmission and focus system  Reflectron time-of-flight mass spectrometer  Metal cluster compounds  Single crystal X-ray diffraction
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