Surface Analysis Lab., Beijing Centre for Physical & Chemical Analysis, P.O. Box 8106, Beijing People's Republic of China
Abstract:
A mixed X-ray source (Al K-Ag L) has been used to obtain the precise Auger parameters (S2p3/2-S KL23L23) for about sixty sulfur-containing compounds. A two-dimensional chemical state plot for the identification of the valence state of sulfur in a compound and of the specific sulfur-containing compound is presented.