Soft X-ray ARPES and Fermiology of strongly correlated electron systems and PES by hard X-ray and extremely low energy photons

Bulk sensitivity is inevitable for photoelectron spectroscopy (PES) when one studies bulk electronic structures of strongly correlated electron systems, which are often much different from surface electronic structures. Combination of soft and hard X-ray PES (SXPES and HAXPES) is a promising approach for this purpose by quantitatively evaluating the contribution of the surface in the observed angle integrated PES spectra. Even in the angle resolved PES studies (ARPES), the bulk sensitivity of the SX-ARPES is required to get the real bulk band dispersions and Fermi surface topology, which may be noticeably modified in the surface region as seen in several materials studied in this paper.Although hard X-ray ARPES is feasible, deep attention is required for the discussion of the possible recoil effects for the valence band. Besides, extremely low energy PES (ELEPES) by use of microwave excited Xe, Kr and Ar lamps will be as useful as those by synchrotron radiation and laser to realize a very high resolution of better than 5 meV with bulk sensitivity under certain conditions.