CuO薄膜的三阶非线性光学特性研究

采用脉冲激光沉积技术在Si(100)和熔石英基片上制备了单相的CuO薄膜.通过X射线衍射仪,拉曼光谱仪,场发射扫描电镜和紫外可见光光度计对薄膜的结构,表面形貌和光学性质进行了表征. 场发射扫描电镜结果表明CuO薄膜中晶粒排列致密且分布均匀,其尺寸约为45nm.结合飞秒激光(800nm,50fs)和Z扫描方法测量了薄膜的三阶非线性光学特性,结果表明CuO薄膜具有超快的非线性光学响应且非线性折射率和非线性吸收系数均为负值,其大小分别为-3.96×10^-17 m^{2< 关键词： CuO薄膜 Z-扫描')" href="#">Z-扫描 三阶光学非线性}

Third-order nonlinear optical properties of CuO film

Single-phase CuO thin films have been obtained on Si(100) and quartz substrates using pulsed laser deposition technique. The structure, surface image, optical transmittance and reflectance of the films were characterized by X-ray diffraction, Raman spectroscopy, scanning electron microscopy and UV-vis spectroscopy. The SEM image demonstrates that the grain size is about 45nm. The third-order optical nonlinearities in CuO films were investigated by Z-scan method using a femtosecond laser (800nm, 50fs). The results show that CuO films have ultrafast nonlinear optical response and large optical nonlinearity with the real and imaginary parts of third-order nonlinear susceptibility, χ⁽³⁾, being -7.88×10^-11 esu and -2.13×10^-11 esu, respectively, indicating CuO thin films are potential materials for applications in nonlinear optical devices.