首页 | 本学科首页   官方微博 | 高级检索  
     检索      

Ar离子注入YBa2Cu3O7-x超导薄膜中微结构变化的透射电子显微镜研究
引用本文:李贻杰,熊光成,甘子钊,任琮欣,邹世昌.Ar离子注入YBa2Cu3O7-x超导薄膜中微结构变化的透射电子显微镜研究[J].物理学报,1993,42(3):482-487.
作者姓名:李贻杰  熊光成  甘子钊  任琮欣  邹世昌
作者单位:(1)北京大学物理系,北京100871; (2)中国科学院上海冶金研究所离子束开放研究实验室,上海200050
摘    要:Ar离子注入YBa2Cu3O7-x超导薄膜后,不仅会引起样品超导转变温度Tc和临界电流密度Jc的下降,还会使样品的正常态由金属型变为半导体型。透射电子显微镜观察发现在小剂量(<5×1012Ar/cm2)注入情况下,样品的晶格结构几乎不受影响。随着注入剂量的增加,晶格损伤越来越严重,最终变成非晶态。对实验结果的分析表明,Ar离子注入引起YBa2< 关键词

收稿时间:4/6/1992 12:00:00 AM

TEM STUDY OF MICROSTRUCTURAL CHANGES INDUCED BY AR ION IMPLANTATION IN YBa2Cu3O7-x SUPERCONDUCTING FILMS
LI YI-JIE,XIONG GUANG-CHENG,GAN ZI-ZHAO,REN CONG-XIN and ZOU SHI-CHANG.TEM STUDY OF MICROSTRUCTURAL CHANGES INDUCED BY AR ION IMPLANTATION IN YBa2Cu3O7-x SUPERCONDUCTING FILMS[J].Acta Physica Sinica,1993,42(3):482-487.
Authors:LI YI-JIE  XIONG GUANG-CHENG  GAN ZI-ZHAO  REN CONG-XIN and ZOU SHI-CHANG
Abstract:Ar ion implantation induced superconductivity change and structural change in YBa2Cu3O7-x epitaxial films have been studied. After implantation, not only Jc and Tc of the sa-mples decreased with the increasing of Ar ion fluence, but also a metal-to-semiconducfor transition occurred. The TEM photographs showed that the lattice frame of the implanted sa-mples was nearly unchanged under low fluence. Only at high fluence, the structure was comple-tely destroyed. According to the experimental results, we suggest that the degradation of Jc and Tc may mainly result from the disordering of oxygen sublattice.
Keywords:
点击此处可从《物理学报》浏览原始摘要信息
点击此处可从《物理学报》下载免费的PDF全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号