| Sm富勒烯的芯态光电子能谱 |
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| 引用本文： | 王晓雄,李宏年.Sm富勒烯的芯态光电子能谱[J].物理学报,2006,55(8):4259-4264. |
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| 作者姓名： | 王晓雄 李宏年 |
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| 作者单位： | 浙江大学物理系，杭州 310027 |
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| 摘 要： | 用X射线光电子能谱研究了Sm掺杂的固态C60相衍变和芯电子态.在SmxC60中Sm的含量x小于0.5时，样品是固溶相；在x=0.5和x=2.75之间的掺杂阶段，样品是这两个相的混合.在x=2.75和x=6之间的高掺杂阶段未观察到相分离的X射线光电子能谱证据.Sm 4f, 4d的实验数据表明Sm的价态是+2.二价Sm 3d5/2芯态谱线存在两个子峰.
关键词：
60的Sm填隙化合物')" href="#">C60的Sm填隙化合物
相结构
电子态
X射线光电子能谱
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| 关 键 词： | C60的Sm填隙化合物 相结构 电子态 X射线光电子能谱 |
| 文章编号： | 1000-3290/2006/55(08)/4259-06 |
| 收稿时间： | 10 23 2005 12:00AM |
| 修稿时间： | 2005-10-232006-03-27 |
Core-level photoemission of Sm fullerides |
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| Wang Xiao-Xiong,Li Hong-Nian.Core-level photoemission of Sm fullerides[J].Acta Physica Sinica,2006,55(8):4259-4264. |
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| Authors: | Wang Xiao-Xiong Li Hong-Nian |
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| Institution: | Department ofPhysics, Zhefiang University, Hangzhou 310027, China |
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| Abstract: | Phases and core-levels of Sm-intercalated C60 thin films are researched with X-ray photoemission spectroscopy. The solid solution phase dominates until the stoichiometry of Sm0.5C60. Below the intercalation level of Sm2.75C60, the sample is phase-separated into the solid solution phase and Sm2.75C60, while the sample is not the mixture of Sm2.75C60 and Sm6C60 with the Sm concentration higher than Sm2.75C60. Experimental data of Sm 4f and 4d clearly reveal the valence state of Sm is divalent for Sm fullerides. Two subpeaks of divalent Sm 3d5/2 level are found. |
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| Keywords: | Sm-intercalated C60 phase structure electronic state X-ray photoemission spectroscopy |
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