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TiN/Al2O3纳米多层膜的共格外延生长及超硬效应
引用本文:孔 明,魏 仑,董云杉,李戈扬.TiN/Al2O3纳米多层膜的共格外延生长及超硬效应[J].物理学报,2006,55(2):770-775.
作者姓名:孔 明  魏 仑  董云杉  李戈扬
作者单位:上海交通大学金属基复合材料国家重点实验室,上海 200030
基金项目:上海市专利技术再创新基金(批准号:037252052)资助的课题.
摘    要:采用多靶磁控溅射法制备了一系列具有不同Al2O3调制层厚度的TiN/Al2O3纳米多层膜. 利用X射线能量色散谱、X射线衍射、扫描电子显微镜、高分辨透射电子显微镜和微力学探针表征了多层膜的成分、微结构和力学性能. 研究结果表明,在TiN/Al2O3纳米多层膜中,单层膜时以非晶态存在的Al2O3层在厚度小于1.5 nm时因TiN晶体层的模板效应而晶化,并与TiN层形成共格外延生长,相应地,多层膜产生硬度明显升高的超硬效应,最高硬度可达37.9 GPa. 进一步增加多层膜中Al2O3调制层的层厚度,Al2O3层逐渐形成非晶结构并破坏了多层膜的共格外延生长,使得多层膜的硬度逐步降低. 关键词: 2O3纳米多层膜')" href="#">TiN/Al2O3纳米多层膜 外延生长 非晶晶化 超硬效应

关 键 词:TiN/Al2O3纳米多层膜  外延生长  非晶晶化  超硬效应
文章编号:1000-3290/2006/55(02)/0770-06
收稿时间:05 10 2005 12:00AM
修稿时间:2005-05-102005-07-24

Epitaxial growth and superhardness effect in TiN/Al2O3 nanomultilayers
Kong Ming,Wei Lun,Dong Yun-Shan and Li Ge-Yang.Epitaxial growth and superhardness effect in TiN/Al2O3 nanomultilayers[J].Acta Physica Sinica,2006,55(2):770-775.
Authors:Kong Ming  Wei Lun  Dong Yun-Shan and Li Ge-Yang
Institution:State Key Laboratory of Metal Matrix Composites, Shanghai Jiaotong University, Shanghai 200030, China
Abstract:TiN/Al2O3 nanomultilayers with various Al2O3 layer thicknesses were prepared by multi_target magnetron sputtering. The chemical composition, microstructure and mechanical properties of these multilayers were characterized by energy dispersive X_ray spectrometry, X_ray diffraction, high_resolution transmission electron microscopy and nanoindentation. The result raveals that under the sputtering conditions, normally amorphous Al2O3 is forced to crystallize at very small layer thicknesses (<1.5 nm), and grows coherently and epitaxially over TiN layers. Correspondingly, the hardness of the multilayers increases significantly and reaches a maximum value of 37.9 GPa. Further increasing in layer thickness, Al2O3 layers form an amorphous structure and block the coherent growth of the multilayers, and thus the hardness decreases gradually.
Keywords:TiN/Al2O3 nanomuhilayers  epitaxial growth  template-induced crystallization  superhardness effect
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