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沉积条件对ZnTe/ZnTe:Cu薄膜结构及CdTe电池性能的影响
引用本文:仲政祥,郑家贵,钟永强,杨帆,冯良桓,蔡伟,蔡亚平,张静全,黎兵,雷智,李卫,武莉莉.沉积条件对ZnTe/ZnTe:Cu薄膜结构及CdTe电池性能的影响[J].物理学报,2009,58(7):4920-4924.
作者姓名:仲政祥  郑家贵  钟永强  杨帆  冯良桓  蔡伟  蔡亚平  张静全  黎兵  雷智  李卫  武莉莉
作者单位:(1)四川大学材料科学与工程学院,成都 610064; (2)中国工程物理研究院,绵阳 621900
基金项目:国家高技术研究发展计划(863)(批准号:2003AA513010),教育部博士点基金(批准号:20050610024)和四川省应用基础项目(批准号:2006J13-08)资助的课题.
摘    要:用共蒸发法沉积了ZnTe/ZnTe:Cu复合多晶薄膜,通过XRD,XPS,C-VI-V等研究了沉积温度对薄膜结构、Cu浓度分布及电池性能的影响.结果表明,沉积温度对薄膜的结构影响不明显,薄膜呈立方相,经185 ℃退火后出现了六方相.对薄膜的剖析发现,Cu浓度分布呈现先上升到一极大值而后快速下降的趋势, 100 ℃沉积的ZnTe/ZnTe:Cu薄膜,ZnTe层起到了阻止Cu扩散作用,用这种薄膜制作的太阳电池XD较大 关键词: ZnTe多晶薄膜 沉积温度 薄膜结构 器件性能

关 键 词:ZnTe多晶薄膜  沉积温度  薄膜结构  器件性能
收稿时间:2007-11-04

The influence of doposition conditions on the structrure of ZnTe/ZnTe:Cu thin films and the properties of CdTe cells
Zhong Zheng-Xiang,Zheng Jia-Gui,Zhong Yong-Qiang,Yang Fan,Feng Liang-Huan,Cai Wei,Cai Ya-Ping,Zhang Jing-Quan,Li Bing,Lei Zhi,Li Wei,Wu Li-Li.The influence of doposition conditions on the structrure of ZnTe/ZnTe:Cu thin films and the properties of CdTe cells[J].Acta Physica Sinica,2009,58(7):4920-4924.
Authors:Zhong Zheng-Xiang  Zheng Jia-Gui  Zhong Yong-Qiang  Yang Fan  Feng Liang-Huan  Cai Wei  Cai Ya-Ping  Zhang Jing-Quan  Li Bing  Lei Zhi  Li Wei  Wu Li-Li
Abstract:Polycrystalline film of ZnTe/ZnTe:Cu is fabricated by co-vaporization. The influence of evaporation temperature on the structue of the film and Cu distribution in the film and performance of the cell fabricated with the films are studied by XRD,XPS, C-V and I-V analysis. The results indicate that, (1) the deposition temeperature has less effecton the structure of the film ZnTe/ZnTe:Cu, (2) the fact that the Cu concentration in the film deposited at 100℃ raises to a maximum and descend rapidly shows the function of ZnTe film in preventing Cu atoms diffusing in the film and the CdTe cell fabricated with the film shows a wider barrier (XD),smaller capacitance, better diode characteristic and larger conversion efficiency.
Keywords:polycrystalline ZnTe film  deposition temperature  structure of films  device performance
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