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低能He~(2+)入射He原子转移电离实验中出射电子成像研究
引用本文:冯文天,马新文,朱小龙,张少峰,刘惠萍,许慎跃,钱东斌,李斌,闫顺成,张大成,孟令杰,张鹏举.低能He~(2+)入射He原子转移电离实验中出射电子成像研究[J].物理学报,2010,59(12):8471-8477.
作者姓名:冯文天  马新文  朱小龙  张少峰  刘惠萍  许慎跃  钱东斌  李斌  闫顺成  张大成  孟令杰  张鹏举
作者单位:(1)中国科学院近代物理研究所,兰州 730000; (2)中国科学院近代物理研究所,兰州 730000;中国科学院研究生院,北京 100049
基金项目:国家自然科学基金(批准号:10434100,10979007)资助的课题.
摘    要:利用反应显微谱仪对70keV He2+-He转移电离过程中的出射电子进行了成像,研究了出射电子的空间速度分布特征.结果表明:电子主要集中在散射平面内;在散射平面内,电子速度分布介于零与入射离子速度Vp之间(即前向出射)且在散射离子和靶核核间轴处有一极小值,呈现出典型的双峰结构.出射电子的上述分布特征可由出射电子波函数σ振幅和π振幅的干涉进行定性解释,σ振幅和π振幅对出射电子波函数的贡献与碰撞参数相关.在小碰撞参数下,π振幅的贡献更加明显;而在大碰撞参数下,σ振幅的贡献更加显著.

关 键 词:反应显微谱仪  转移电离  电子速度分布  σ振幅和π振幅干涉
收稿时间:2010-01-29

Momentum image of emission electrons in transfer ionization process of slow He2+ colliding on He
Feng Wen-Tian,Ma Xin-Wen,Zhu Xiao-Long,Zhang Shao-Feng,Liu Hui-Ping,Xu Shen-Yue,Qian Dong-Bin,Li Bin,Yan Shun-Cheng,Zhang Da-Cheng,Meng Ling-Jie,Zhang Peng-Ju.Momentum image of emission electrons in transfer ionization process of slow He2+ colliding on He[J].Acta Physica Sinica,2010,59(12):8471-8477.
Authors:Feng Wen-Tian  Ma Xin-Wen  Zhu Xiao-Long  Zhang Shao-Feng  Liu Hui-Ping  Xu Shen-Yue  Qian Dong-Bin  Li Bin  Yan Shun-Cheng  Zhang Da-Cheng  Meng Ling-Jie  Zhang Peng-Ju
Institution:Insititute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China;Graduate University of Chinese Academy of Sciences, Beijing 100049, China;Insititute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China;Insititute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China;Insititute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China;Graduate University of Chinese Academy of Sciences, Beijing 100049, China;Insititute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China;Insititute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China;Graduate University of Chinese Academy of Sciences, Beijing 100049, China;Insititute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China;Insititute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China;Graduate University of Chinese Academy of Sciences, Beijing 100049, China;Insititute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China;Graduate University of Chinese Academy of Sciences, Beijing 100049, China;Insititute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China;Insititute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China;Graduate University of Chinese Academy of Sciences, Beijing 100049, China;Insititute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China;Graduate University of Chinese Academy of Sciences, Beijing 100049, China
Abstract:The velocity distribution of emission electrons in the transfer ionization process of 70keV He2+ colliding on He has been studied with a reaction microscope. These distributions show that the electrons lie mainly in the scattering plane which are observed to be emitted preferentially in the forward direction, lying between 0 and projectile velocity Vp. The distributions also display a typical two-fingered structure with a local minimum on internuclear axis. This characteristic can be qualitatively explained as being due to the interference between σ amplitude and π amplitude of electrons final wavefunction. It depends also on the impact parameters; the π amplitude contribution is dominant at small impact parameters, which leads to a symmetric velocity distribution around the internuclear axis. However, at large impact parameters the σ amplitude contribution increases relatively obviously, resulting in an asymmetric electrons velocity distribution around the internuclear axis.
Keywords:reaction microscope  transfer ionization  velocity distributions of electrons  interference of σ amplitude and π amplitude
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