YBa2Cu3O7-x涂层导体的外延生长和性能对CeO2缓冲层的依赖性

利用倾斜衬底沉积法在无织构的金属衬底上生长了MgO双轴织构的模板层，在这一模板层上实现了YBa₂Cu₃O_7-x薄膜的外延生长.在外延YBa₂Cu₃O_7-x薄膜前，依次沉积了钇稳定的立方氧化锆和CeO₂作为缓冲层.利用X射线衍射2θ扫描、扫描、Ω扫描和极图分析测定了这些膜的结构和双轴织 关键词： 2Cu₃O_7-x镀膜导体')" href="#">YBa₂Cu₃O_7-x镀膜导体 2缓冲层')" href="#">CeO₂缓冲层 厚度依赖性 外延生长

Dependence of growth and property of YBa2Cu3O7-x coated conductors on the thickness of CeO2 buffer layer

Biaxially textured MgO templates were grown on un-textured metal substrates by inclined-substrate-deposition and YBa₂Cu₃O_7-x films were epitaxially grown on these substrates by pulsed laser deposition. Yttria-stablized-zirconia and CeO₂ were deposited in turn as buffer layers prior to YBa₂Cu₃O_7-x growth. The biaxial alignment features of the films were examined by X-ray diffraction 2θ-scan，pole-figure，-scan and rocking curve of Ω angles. The Raman spectroscopy，scanning electron microscopy and atomic force microscopy were used to characterize the orientation order，morphology and surface roughness of the YBa₂Cu₃O_7-x films，respectively. The influence of the thickness of CeO₂ on the properties of the YBa₂Cu₃O_7-x films were investigated and the singnificant and unique dependence of the properties of YBa₂Cu₃O_7-x films on the thickness of CeO₂ were revealed. The possible mechanisms for this dependence were discussed.