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La掺杂SrBi4Ti4O15铁电材料性能研究
引用本文:朱 骏,卢网平,刘秋朝,毛翔宇,惠 荣,陈小兵.La掺杂SrBi4Ti4O15铁电材料性能研究[J].物理学报,2003,52(6):1524-1528.
作者姓名:朱 骏  卢网平  刘秋朝  毛翔宇  惠 荣  陈小兵
作者单位:扬州大学物理科学与技术学院,扬州 225002
基金项目:江苏省教育厅自然科学基金(批准号:01KJB140011)资助的课题.
摘    要:按x=0.00,0.10,0.25,0.50,0.75和1.00,采用固相烧结工艺,制备了不同La掺杂量的SrBi4-xLaxTi4O15的陶瓷样品. 用x射线衍射对其微结构进行了分析,并测量了铁电、介电性能.结果发现,La掺杂未改变SrBi4Ti 4O15的晶体结构.随掺杂量的增加,样品的矫顽场(Ec)下降,剩余极化(2P关键词: 4-xLaxTi4O15')" href="#">SrBi4-xLaxTi4O15 La掺杂 铁电性能 相变温度 弛豫铁电

关 键 词:SrBi4-xLaxTi4O15  La掺杂  铁电性能  相变温度  弛豫铁电
文章编号:1000-3290/2003/52(06)/1524-05
收稿时间:2002-09-23
修稿时间:2002年9月23日

Study of properties of lanthanum doped SrBi4Ti4O15 ferroelectric ceramics
Zhu Jun,Lu Wang-Ping,Liu Qiu-Chao,Mao Xiang-Yu,Hui Rong and Chen Xiao-Bing.Study of properties of lanthanum doped SrBi4Ti4O15 ferroelectric ceramics[J].Acta Physica Sinica,2003,52(6):1524-1528.
Authors:Zhu Jun  Lu Wang-Ping  Liu Qiu-Chao  Mao Xiang-Yu  Hui Rong and Chen Xiao-Bing
Abstract:Ceramic samples SrBi4-xLaxTi4O15 (x =0.00, 0.10, 0.25, 0.50, 0.75, 1.00), have been prepared by solid-state reaction method. T heir structure was analyzed by x-ray diffraction, and their dielectricity and fe rroelectricity were measured. It is found that La-doping does not change the cry stal structure of SrBi4Ti4O15. The remnant pola rization (2P4) in creases at first, then decreases with the increase of La content. The 2P4 reaches a maximum value of 24.2 μC·cm-2, when x is 0.25. The c oerc ive field of SrBi3.75La0.25Ti4O15 is 60.8 kV·cm-1 . The 2P4 increases by about 50% and the Ec decrease s near 25%, compa red with these of SrBi4Ti4O15. Obviously, the f erroelectricity of SrBi 4Ti4O15 is improved by lanthanum doping. The te mperature of p hase transition (Tc) decreased with La cloping. The Tc of SrBi3.75La0.25Ti4O15 is 451 ℃. When x=0.75 and 1.00, the SrBi4-xLaxTi4O15 exhibit the typical characteristics of relaxor ferro electrics.
Keywords:SrBi4-xLaxTi4O15  La dop ing  ferroelectricity  temperature of phase transition  relaxor ferroelectrics
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