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声光器件的换能器带宽和镀层厚度的确定
引用本文:徐介平.声光器件的换能器带宽和镀层厚度的确定[J].物理学报,1979,28(6):796-806.
作者姓名:徐介平
作者单位:北京工业大学
摘    要:根据压电换能器的Mason等效电路,就36°у切LN/PM声光器件和x切LN/TeO2声光器件以及各种镀层材料和厚度计算了换能器损耗TL随规一化频率f/f0的变化关系,由此可确定各镀层的厚度和器件的换能器带宽,还给出器件的电输入阻抗zi在阻抗圆图上随f/f0变化的轨迹,它可作为器件性能测试的理论依据。 关键词

收稿时间:1978-07-24

THE TRANSDUCER BANDWIDTH OF ACOUSTO-OPTIC DEVICES AND THE DETERMINATION OF THE LAYERS' THICKNESS
XU JIE-PING.THE TRANSDUCER BANDWIDTH OF ACOUSTO-OPTIC DEVICES AND THE DETERMINATION OF THE LAYERS'' THICKNESS[J].Acta Physica Sinica,1979,28(6):796-806.
Authors:XU JIE-PING
Abstract:According to the Mason's equivalent circuit of piezoelectric transducer, we have calculated the functional relationship between transducer loss TL and normalized frequency f/f0 for the 36°y-cut LN/PM and the x-cut LN/TeO2 acousto-optic devices, with different layer materials and thickness. From these calculations, we can determine the thickness of the various layers rationally and the transducer bandwidth of the devices accurately. We give also the loci of the electric input- impedence Zi with f/f0 on the Smith chart, which can be used as theoretical foundation of quality tests for the devices.
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