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热丝法制备纳米晶硅薄膜结构及沉积机制的研究
引用本文:陈国,郭晓旭,朱美芳,孙景兰,许怀哲,韩一琴.热丝法制备纳米晶硅薄膜结构及沉积机制的研究[J].物理学报,1997,46(10):2015-2022.
作者姓名:陈国  郭晓旭  朱美芳  孙景兰  许怀哲  韩一琴
作者单位:中国科学技术大学研究生院物理系;半导体超晶格国家重点实验室
摘    要:用热丝法制备了纳米晶硅薄膜.通过Raman散射谱及X射线谱,系统地研究了沉积气压Pg、高H2稀释及衬底与钨丝之间距离对沉积速率、纳米硅薄膜的形成和结构等的影响.计算了沉积过程中的温度场分布.讨论了沉积过程中反应基元的输运和相关的气相反应,以及H在薄膜生长中的作用,由此分析了沉积参量对薄膜结构的影响,得到了与实验相一致的结果. 关键词

关 键 词:热丝法  纳米晶    薄膜结构  沉积
收稿时间:1996-11-05

INVESTIGATION OF GROWTH MECHANISM OF NANOCRYSTALLINE SILICON THIN FILMS PREPARED BY HOT-FILAMENT CHEMICAL VAPOR DEPOSITION
CHEN GUO,GUO XIAO-XU,ZHU MEI-FANG,SUN JING-LAN,XU HUAI-ZHE and HAN YI-QIN.INVESTIGATION OF GROWTH MECHANISM OF NANOCRYSTALLINE SILICON THIN FILMS PREPARED BY HOT-FILAMENT CHEMICAL VAPOR DEPOSITION[J].Acta Physica Sinica,1997,46(10):2015-2022.
Authors:CHEN GUO  GUO XIAO-XU  ZHU MEI-FANG  SUN JING-LAN  XU HUAI-ZHE and HAN YI-QIN
Abstract:The nc Si∶H thin films were prepared by hotfilament vapor deposition.The effect of gas pressure,-high H2 dilution and substrate-to-filament distance on deposition rate,the formation and structure of nc-Si∶H films was systematically studied.The structure of nc-Si∶H was determined using Raman scattering and X-ray diffraction.The temperature distribution was calculated;the travel of radicals evaporated from the filament and the gas-phase reaction were discussed in detail.The results were in agreement with the measurement.
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