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自由和随机介电弛豫
引用本文:李景德,李家宝,符史流,沈文彬.自由和随机介电弛豫[J].物理学报,1992,41(1):155-161.
作者姓名:李景德  李家宝  符史流  沈文彬
作者单位:中山大学物理系,广州,510275;中山大学物理系,广州,510275;中山大学物理系,广州,510275;中山大学物理系,广州,510275
基金项目:国家教育委员会博士点基金
摘    要:本文介绍一种傅里叶变换介电谱仪方法,它可简化解谱过程,并节省数据内存量,使用这台仪器证明了同一电介质样品在不同条件下自由或随机弛豫可出现于106至10-4s的时间范围,这和唯象理论的预言一致,弛豫时间与连接样品两个电极的测量电路的电阻R有关,大的R值给出开路弛豫时间,小的R值导致短路极限,开路弛豫时间比短路值可以大106倍,给出了从开路到短路情况复介电常数频域谱的变化。


THE FREE AND RANDOM DIELECTRIC RELAXATIONS
LI JING-DE,LI JIA-BAO,FU SHI-LIU and SHEN WEN-BIN.THE FREE AND RANDOM DIELECTRIC RELAXATIONS[J].Acta Physica Sinica,1992,41(1):155-161.
Authors:LI JING-DE  LI JIA-BAO  FU SHI-LIU and SHEN WEN-BIN
Abstract:A method of Fourier transform dielectric spectrometer is described, it leads to simplifying the process of solving spectrum and to save the memory capacity for data. Using this method, it is shown that for the same dielectric sample the free and random relaxation will appear under different condition in the time range of 106 to 10-4 seconds, that was predicted by the phe-nomenoiogical theory. The relaxation times are related to the resistance R of the measurement circuit joinning the two electrodes of the sample.. Large value of R leads to a relaxation time of open circuit, and small ones lead to the limit of short circuit; the relaxation time of open ciecuit may be as large as 106 times of the short circuit one. The variation in frequancy domain spectrums of complex dielectric constant is given from open to short circuit cases.
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