丝网印刷FeS2（pyrite）薄膜的结构及光电性能

采用丝网印刷方法制备了FeS₂(pyrite)薄膜，用x射线衍射确定了样品FeS₂(pyrite)薄 膜的 晶体结构，并用Rietveld方法对样品的结构进行了精修，确定了样品的点阵常数、键长、键 角、硫原子占位等结构参数.研究了膜厚对方块电阻、载流子浓度、霍尔迁移率、光能隙等 光电参数的影响. 关键词： 丝网印刷 薄膜 结构 Rietveld方法 光电性能

The structural optical and electrical properties of films prepared by screen print

Thin films of iron pyrite(FeS 2)have been prepared by screen print. X ray diffraction (XRD) patterns were used to identify the nature of the films. Special attention has been devoted to the structural parameters(cell and sulfur positional parameter), bond distances and angles, lattice constants. The procedure used in this study was the full profile refinement of x ray powder diffraction patterns using the Rietveld method. Here we report on the influnce of film thickness for resitivity, Hall mobility and optical energy gap etc.