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低密度聚乙烯热压成型过程中的空间电荷
引用本文:安振连,杨强,郑飞虎,张冶文.低密度聚乙烯热压成型过程中的空间电荷[J].物理学报,2007,56(9):5502-5507.
作者姓名:安振连  杨强  郑飞虎  张冶文
作者单位:同济大学波耳固体物理研究所,上海 200092
摘    要:借助开路热刺激放电(TSD)电流及原位实时电荷TSD和电荷等温衰减测量,研究了低密度聚乙烯(LDPE)在热压成型过程中所产生的空间电荷特性.结果表明具有良好室温稳定性的成型电荷被束缚在两类陷阱能级中:浅阱和深阱,其陷阱中心深度分别约为0.92eV和1.31eV.初步的分析进一步表明了它们应该分别位于试样的表层和体内,为近表面陷阱和体陷阱. 关键词: 低密度聚乙烯(LDPE) 热压成型 空间电荷 热刺激放电(TSD)

关 键 词:低密度聚乙烯(LDPE)  热压成型  空间电荷  热刺激放电(TSD)
文章编号:1000-3290/2007/56(09)/5502-06
收稿时间:2007-01-16
修稿时间:2/6/2007 12:00:00 AM

Space charges formed in the hot compression molding process of low density polyethylene
An Zhen-Lian,Yang Qiang,Zheng Fei-Hu,Zhang Ye-Wen.Space charges formed in the hot compression molding process of low density polyethylene[J].Acta Physica Sinica,2007,56(9):5502-5507.
Authors:An Zhen-Lian  Yang Qiang  Zheng Fei-Hu  Zhang Ye-Wen
Institution:Pohl Institute of Solid State Physics, Tonal University, Shanghai 200092, China
Abstract:The properties of space charges formed in the hot compression molding process of low density polyethylene (LDPE) have been studied by measuring the open-circuit thermally stimulated discharge (TSD) current, in situ TSD charge and the isothermal charge decay. The results showed that the space charges with high stability at room temperature (RT) are trapped in two kinds of traps: shallow traps and deep traps with central depths of about 0.92eV and 1.31eV, respectively. Preliminary analysis indicates that the shallow traps and deep traps should be located in the surface layer and in the bulk of the sample, forming surface traps and bulk traps,respectively.
Keywords:low density polyethylene (LDPE)  hot compression molding  space charge  thermally stimulated discharge (TSD)
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