首页 | 本学科首页   官方微博 | 高级检索  
     检索      

厚度对非极性聚合物薄膜驻极体电荷储存及电荷动态特性的影响
引用本文:吴贤勇,夏钟福,安振连,张鹏锋.厚度对非极性聚合物薄膜驻极体电荷储存及电荷动态特性的影响[J].物理学报,2004,53(12):4325-4329.
作者姓名:吴贤勇  夏钟福  安振连  张鹏锋
作者单位:同济大学波耳固体物理研究所,上海 200092
基金项目:国家自然科学基金(批准号:50073016)和德国大众汽车基金(批准号:I/77365)资助的课题.
摘    要:以Du Pont公司的商用Teflon FEP A型薄膜为例,通过热脉冲技术、等温表面电位衰减测量和开路热刺激放电电流谱分析等实验结果,讨论了经常温和高温电晕充电后样品厚度对薄膜驻极体的沉积电荷密度、薄膜驻极体的内电场、体电导率以及电荷储存稳定性的影响.通过热脉冲技术组合电导率温度曲线的测量,研究了在不同温度条件下样品厚度对沉积电荷层的平均电荷重心移动的影响.结果表明:在充电参数一定的条件下,随着膜厚的降低,储存电荷密度上升,但电荷稳定性有所下降.因此,合理地调控薄膜厚度,可以有效地优化驻极体的电荷储存能 关键词: 厚度 驻极体 电荷储存能力 电荷稳定性

关 键 词:厚度  驻极体  电荷储存能力  电荷稳定性
收稿时间:2003-12-29

Influence of thickness on charge storage and dynamic properties of non-polar film electrets
Wu Xian-Yong,XIA Zhong-fu,An Zhen-Lian,ZHANG Peng-feng.Influence of thickness on charge storage and dynamic properties of non-polar film electrets[J].Acta Physica Sinica,2004,53(12):4325-4329.
Authors:Wu Xian-Yong  XIA Zhong-fu  An Zhen-Lian  ZHANG Peng-feng
Abstract:In this paper, taking commercial Teflon FEP films of Du Pont Co. as an example, the influence of sample thickness on deposited charge density, the internal electrical field of film electrets charged at room and elevated temperatures, and on their bulk conductivity and c harge storage stability is discussed by means of heat pulse technique, measurement of isothermal surface potential decay and analysis of open circuit thermally stimulated discharge current spectra. The influence of the thickness on the shift of mean charge depth of the deposited charge layer under different temperature conditions is also investigated by the measurements of heat pulse technique in combination with conductivity glow curve. The results indicate that under the same charging conditions and with the decrease of the sample thickness, charge density increases, but at the same time charge storage stability is decreased gradually. Therefore, the charge storage capability and charge stability can be optimized by reasonably regulating the thickness of the sample.
Keywords:thickness  electret  charge storage capability  charge stability
本文献已被 CNKI 维普 万方数据 等数据库收录!
点击此处可从《物理学报》浏览原始摘要信息
点击此处可从《物理学报》下载免费的PDF全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号