| 层状结构铁电材料热压择优取向度的X射线测定法 |
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| 引用本文： | 郭常霖,吴毓琴.层状结构铁电材料热压择优取向度的X射线测定法[J].物理学报,1980,29(12):1640-1644. |
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| 作者姓名： | 郭常霖 吴毓琴 |
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| 作者单位： | 中国科学院上海硅酸盐研究所 |
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| 摘 要： | 本文提出了层状结构铁电陶瓷经热压后材料择优取向度的定义和X射线测定方法。只需测定任一或数条(00l)衍射线加压前后衍射强度比值,即可求出取向度。用含铋层优化合物pbBi4Ti4O15作为测定实例,证明了这一方法的适用性。
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| 收稿时间： | 1980-03-20 |
AN X-RAY METHOD OF DETERMINING THE DEGREE OF PREFERRED ORIENTATION OF FERROELECTRIC MATERIAL WITH LAYER TYPE STRUCTURE AFTER HOT-PRESSING |
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| GUO CHANG-LIN and WU YU-QIN.AN X-RAY METHOD OF DETERMINING THE DEGREE OF PREFERRED ORIENTATION OF FERROELECTRIC MATERIAL WITH LAYER TYPE STRUCTURE AFTER HOT-PRESSING[J].Acta Physica Sinica,1980,29(12):1640-1644. |
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| Authors: | GUO CHANG-LIN and WU YU-QIN |
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| Abstract: | The definition and an X-ray determination method of the degee of preferred orientation of ferroelectric ceramics with layer type structure after hot-pressing procedure are presented. The degree of preferred orientation can be obtained by merely determining the ratio of diffraction intensity of any one or more (00l) lines before and after hot-pressing procedure. Taking the mixed bismuth oxide compound with layer type structure PbBi4Ti4O15 as an example the suitability of this method has been proved. |
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