Subthreshold photoemission from copper nanoclusters on the SiO2 surface |
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| Authors: | Solov’ev S M Potekhina N D |
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| Institution: | (1) Khakassian State University, Lenin Avenue 90, Abakan, Russia, 655017;(2) Tver State University, Sadoviy per. 35, Tver, Russia, 170002; |
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| Abstract: | Subthreshold photoemission from copper nanoclusters formed on the SiO2 surface has been observed under irradiation of the surface by photons in the 3.1–6.5-eV energy range. The average size of
copper nanoclusters on the silicon oxide surface is 250–500 nm. Besides the conventional photoemission from the filled Shockley
surface state (SS), strong photoemission has been recorded at incident photon energies of 0.5 eV below the work function of
the copper surface. This emission is assumed to be generated in direct electron transitions from the SS state to the unfilled
electron surface states formed by the Coulomb image potential, followed by escape from these states into vacuum. |
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