Fluctuational dissipative electromagnetic interaction between a nanoprobe and a surface

In the framework of fluctuational electromagnetic theory, analytical expressions are obtained for the dynamic dissipative damping forces acting on the probe of an atomic-force microscope (AFM), as well as between two plane surfaces at their contact. The contacts between materials typical of AFM, quartz-microbalance, and surface-force apparatus experiments are considered. The conditions for nondissipative slide are discussed. A comparison between the calculated oscillator quality factor associated with fluctuational dissipative forces and its values obtained in AFM experiments with a silicon probe and a mica sample shows that they are of the same order of magnitude; therefore, an experimental investigation of such forces is feasible.