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Elliptically-bent crystal spectrograph for X-ray diagnosis of laser-produced plasmas
作者姓名:熊先才  钟先信  肖沙里  杨国洪  高洁
作者单位:Key Laboratory of Optoelectronic Technology and System,Chongqing University,Chongqing 400044,Key Laboratory of Optoelectronic Technology and System,Chongqing University,Chongqing 400044,Key Laboratory of Optoelectronic Technology and System,Chongqing University,Chongqing 400044,Research Center of Laser Fusion,China Academy of Engineering Physics,Mianyang 621900,Key Laboratory of Optoelectronic Technology and System,Chongqing University,Chongqing 400044
基金项目:This work was supported by the High-Technology Research and Development Program of Chinaunder Grant No.863-804-3.
摘    要:In order to measure spatially and temporarily resolved laser-produced plasma X-ray spectra in 0.2 - 2 nm region, a novel two-channel elliptically-bent crystal spectrograph has been developed. Dispersive elements are LiF, PET, Mica, and KAP crystals, which cover Bragg angles in the range of 30 - 67.5 degrees. Eccentricity and focal distance of twin ellipses are 0.9586 and 1350 mm, respectively. Spatially resolved spectrum is photographically recorded with an X-ray film or X-CCD camera in one channel, and temporarily resolved one is photographically recorded with an X-ray streak camera in another channel, thus spatially and temporarily resolved spectra can be simultaneously obtained. Spectral images were acquired with X-CCD and PET in SHENGUANG-II laser facility, and experimental results show that the spectral resolution of the spectrograph is about 0.002 nm.

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