Institution: | Zhen Li1,2,Jun Zhou1,Bing He1,Xijia Gu 3,Yunrong Wei1,Jingxing Dong 1,and Qihong Lou 1 1 Shanghai Key Laboratory of All Solid-State Laser and Applied Techniques,Shanghai Institute of Optics and Fine Mechanics,Chinese Academy of Sciences,Shanghai 201800,China 2 Graduate University of Chinese Academy of Sciences,Beijing 100049,China 3 Department of Electrical and Computer Engineering,Ryerson University,Toronto M5B2K3,Canada |