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Feasibility analysis of junction temperature measurement for GaN-based high-power white LEDs by the peak-shift method |
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| Authors: | Jingjing Zhang Tao Zhang Shishen Liu Shidong Yuan Yafang Jin Sheng Yang |
| Institution: | [1]Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China [2]National Center for Quality Inspection and Supervision of LED Product, Changzhou 213001, China [3]Changzhou Institute of Opto-Electronic Technology, Changzhou 213164, China [4]School of Electronic Engineering and Optoelectronics Technology, Nanjing University of Science and Technology, Nanjing 210094, China |
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