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| Calculation and analysis of Mueller matrix in light scattering detection | |
| 作者姓名： | Keding Yan Shouyu Wang Shu Jiang Liang Xue Yuanyuan Song Zhengang Yan Zhenhua Li |
| 作者单位： | Keding Yan:Department of Information Physics &Engineering, Nanjing University of Science &Technology, Nanjing 210094, China Shouyu Wang:Department of Information Physics &Engineering, Nanjing University of Science &Technology, Nanjing 210094, China Shu Jiang:704 Institute, China Shipbuilding Industry Corporation, Shanghai 200031, China Liang Xue:College of Electronic and Information Engineering, Shanghai University of Electric Power, Shanghai 200090, China Yuanyuan Song:China North Vehicle Research Institute, Beijing 100072, China Zhengang Yan:Xi'an Modern Control Technology Institute, Xi'an 710065, China Zhenhua Li:Department of Information Physics &Engineering, Nanjing University of Science &Technology, Nanjing 210094, China |
| 摘 要： | A new criterion for target detection and identification is proposed to realize metal/dielectric identification and recognition based on Mueller matrix analysis. By using randomly rough surfaces as targets, numerical calculations are used to prove the robustness and accuracy of the criterion. Moreover, to the best of our knowledge, this is the first time to successfully explain the criterion by theoretical analysis. We believe the work orovides an important reference for polarization imaging in laser radar and remote sensing, and so on. |
| 关 键 词： | 矩阵分析 数值计算 光散射检测器 随机粗糙表面 成像激光雷达 目标探测 鲁棒性 s偏振 |
| 收稿时间： | 2014/4/3 |
Calculation and analysis of Mueller matrix in light scattering detection |
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| Keding Yan,Shouyu Wang,Shu Jiang,Liang Xue,Yuanyuan Song,Zhengang Yan,Zhenhua Li.Calculation and analysis of Mueller matrix in light scattering detection[J].中国光学快报(英文版),2014,12(9):92901-91. | |
| Institution: | [1]Department of Information Physics & Engineering, Nanjing University of Science & Technology, Nanjing 210094, China; [2]704 Institute, China Shipbuilding Industry Corporation, Shanghai 200031, China; [3]College of Electronic and Information Engineering, Shanghai University of Electric Power, Shanghai 200090, China; [4]China North Vehicle Research Institute, Beijing 100072, China; [5]Xi'an Modern Control Technology Institute, Xi'an 710065, China |
| Abstract: | A new criterion for target detection and identification is proposed to realize metal/dielectric identification and recognition based on Mueller matrix analysis. By using randomly rough surfaces as targets, numerical calculations are used to prove the robustness and accuracy of the criterion. Moreover, to the best of our knowledge, this is the first time to successfully explain the criterion by theoretical analysis. We believe the work provides an important reference for polarization imaging in laser radar and remote sensing, and so on. |
| Keywords: | 290 5880 240 5770 290 0290 240 0240 |
| 本文献已被 CNKI 维普 等数据库收录！ | |