|
|||||
|
|
Detection of subsurface defects of fused silica optics by confocal scattering microscopy |
|
| Authors: | Bin Ma Zhengxiang Shen Pengfei He Yiqin Ji Tian Sang Huasong Liu Dandan Liu and Zhanshan Wang |
| Institution: | [1]Institute of Precision Optical Engineering, Tongji University, Shanghai 200092, China [2]School of Aerospace Engineering and Applied Mechanics, Tongji University, Shanghai 200092, China [3]Tianjin Key Laboratory of Optical Thin Films, Tianfin Jinhang Institute of Technical Physics, Tianjin 300192, China [4]Department of Physics, Qiannan Normal College for Nationalities, Duyun 558000, China |
| Abstract: | |
| Keywords: | |
| 本文献已被 CNKI 维普 等数据库收录！ | |