Study of X-ray Kirkpatrick-Baez imaging with single layer |
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| Authors: | Baozhong Mu Zhanshan Wang Shengzhen Yi Xin Wang Shengling Huang Jingtao Zhu Chengchao Huang |
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| Institution: | Institute of Precision Optical Engineering, Physics Department, Tongji University, Shanghai 200092, China |
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| Abstract: | The X-ray Kirkpatrick-Baez(KB)imaging experiment with single layer is implemented.Based on the astigmatism aberration and residual geometric aberration of a single mirror.a KB system with 16x mean magnification and approxinlately 0.45° grazing incidence angle is designed.The mirrors are deposited with an Ir layer of 20-nm thickness.Au grids backlit by X-ray tube of 8 keV are imaged via the KB system on scintillator charge-coupled device(CCD).In the ±80 μm field,resolutions of less than 5 μm are measured.The result is in good agreenmnt with the simulated imaging. |
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