| 使用光纤白光干涉仪测一维形变实验 |
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| 引用本文： | 李叶芳,柳华.使用光纤白光干涉仪测一维形变实验[J].物理实验,2007,27(3):7-9. |
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| 作者姓名： | 李叶芳 柳华 |
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| 作者单位： | 大连理工大学物理系,辽宁,大连,116024 |
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| 摘 要： | 光纤白光干涉仪是使用波长为1310 nm的半导体发光二极管的相位调制型光纤传感器,可用于压力、温度和应变的测量.本文介绍了光纤白光干涉仪的工作原理,设计了一维形变实验.
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| 关 键 词： | 光纤白光干涉仪 一维形变 零级干涉条纹 半导体发光二极管 |
| 文章编号： | 1005-4642（2007）03-0007-03 |
| 修稿时间： | 2006-06-20 |
Measuring one-dimensional deformation using white-light fiber interferometer |
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| LI Ye-fang,LIU Hua.Measuring one-dimensional deformation using white-light fiber interferometer[J].Physics Experimentation,2007,27(3):7-9. |
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| Authors: | LI Ye-fang LIU Hua |
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| Institution: | Department of Physics, Dalian University of Technology, Dalian 116024, China |
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| Abstract: | White-light fiber interferometer is a kind of phase modulated fiber-optic sensor,which uses 1 310 nm semiconductor LED.The principle of the white-light fiber interferometer is introduced,and one-dimensional deformation experiment is designed. |
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| Keywords: | white-light fiber interferometer one-dimensional deformation zero order interference fringe semiconductor LED |
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