Digital holographic microscopy characterization of superdirective beam by metamaterial |
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Authors: | Di Caprio Giuseppe Dardano Principia Coppola Giuseppe Cabrini Stefano Mocella Vito |
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Institution: | Institute for Microelectronics and Microsystems (IMM) of the National Council of Research (CNR) Unità di Napoli, Napoli, Italy. giuseppe.dicaprio@na.imm.cnr.it |
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Abstract: | Digital holographic microscopy (DHM) has been successfully applied for the first time to characterize the radiative out-of-plane emission properties of a superdirective device. Complementarily to near-field microscopy, DHM allows us to reconstruct the beam in the far-field region. The angular dispersion of the light beam radiated from a grating composed of air and anti-air metamaterial has been determined, and the proposed technique has highlighted a collimation degree higher than 0.04°, as already evaluated in a previous work. Further considerations on the retrieved phase map of the beam in the acquisition plane are presented. |
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