Measurement of birefringence in thin-film waveguides by Rayleigh scattering |
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Authors: | Janz S Cheben P Dayan H Deakos R |
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Institution: | Institute for Microstructural Sciences, National Research Council Canada, Montreal Road, Ottawa, Ontario, K1A 0R6 Canada. siegfried.janz@nrc-cnrc.gc.ca |
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Abstract: | A method of measuring birefringence in slab and ridge waveguides based on the coherent superposition of Rayleigh light scattering from TE and TM polarized modes is described and demonstrated in silica-on-silicon waveguides. A measurement accuracy of approximately 10(-6) has been achieved. This method is used to determine the evolution of waveguide birefringence with annealing temperature in phosphorous-doped glass waveguides. The measured birefringence increases rapidly with annealing temperatures up to 800 degrees C but remains unchanged for higher-temperature anneals. We interpret this threshold as the temperature above which glass can flow. |
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