Diffraction et mesure de Palm des processus ponctuels

Using the notion of Palm measure, we prove the existence of the diffraction measure of all stationary and ergodic point processes. We get precise expressions of those measures in the case of specific processes: stochastic subsets of $\text{Z}{}^{\mathrm{d}}$, sets obtained by the “cut-and-project” method. To cite this article: J.-B. Gouéré, C. R. Acad. Sci. Paris, Ser. I 336 (2003).