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可靠性系列知识讲座 第四讲:可靠性增长试验的统计分析与设计
引用本文:陈家鼎,房祥忠.可靠性系列知识讲座 第四讲:可靠性增长试验的统计分析与设计[J].数理统计与管理,2012(6):1028-1038.
作者姓名:陈家鼎  房祥忠
作者单位:北京大学数学科学学院
摘    要:新产品的研制工作要经历若干个阶段,每个阶段都是在前一阶段的基础上针对产品在设计、材料或工艺等方面的缺点采取改进措施,以便产品的可靠度得到提高。本文在一般公认的假定—次序约束下,综合利用各阶段的数据给出了最后阶段产品可靠度的点估计和置信下限,它比只利用最后阶数据得到的点估计和置信下限更为合理。此处,还对可靠性增长试验的设计提出了有价值的建议。

关 键 词:可靠性增长试验  顺序约束  置信下限

The Statistical Analysis and Design of the Reliability Growth Tests
CHEN Jia-ding,FANG Xiang-zhong.The Statistical Analysis and Design of the Reliability Growth Tests[J].Application of Statistics and Management,2012(6):1028-1038.
Authors:CHEN Jia-ding  FANG Xiang-zhong
Institution:(School of Mathematical Sciences,Peking University,Beijing 100871,China)
Abstract:The process of inventing a new sort of products may often be made up of several stages.Since the improvement in the design,materials or making arts,it is naturally to suppose that the reliability of the products increase stage by stage.Only under this assumption in this paper,We give a lower confidence limit of the reliability of the products in the last stage.This confidence limit sums up the data including all the former stages and is better than that one obtained only by the data of the last stage. In addition,a valuable suggestion for the design of the tests is given.
Keywords:reliability growth test  order constraints  lower confidence limit
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