| 串并联可修系统的可靠性 |
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| 引用本文： | 谭利,顾九华.串并联可修系统的可靠性[J].数学理论与应用,2007,27(2):31-35. |
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| 作者姓名： | 谭利 顾九华 |
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| 作者单位： | 中南大学数学科学与计算技术学院 长沙410075 |
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| 摘 要： | 本文通过密度演化法讨论了部件的寿命和修理时间都服从一般分布的由n个不同子系统串并联组成的可修系统的可靠性,为串并联系统的可靠性研究提供了理论依据.
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| 关 键 词： | 串并联可修系统 可靠性 密度演化法 |
| 修稿时间： | 2007-01-02 |
The reliability of repairable series-parallel system |
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| Tanli Gu Jiuhua.The reliability of repairable series-parallel system[J].Mathematical Theory and Applications,2007,27(2):31-35. |
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| Authors: | Tanli Gu Jiuhua |
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| Institution: | School of Mathematical Sciences and Computing Technology Central South University, Changsha,410075 |
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| Abstract: | This paper is devoted to studying the reliability of the repairable series-parallel system which consists of Ndifferent subsystems.The life-span and repair time of the components are subject to general distributions.Density evolution method is used to solve the problem.And it provides theoretical foundation to the study of the reliability of repairable series-parallel system. |
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| Keywords: | repairable series-parallel system reliability density evolution method |
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