Some properties of double designs in terms of lee discrepancy |
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Authors: | Na ZOU Hong QIN |
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Institution: | The School of Statistics and Mathematics, Zhongnan University of Economics and Law, Wuhan 430073, China;Faculty of Mathematics and Statistics, Central China Normal University, Wuhan 430079, China |
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Abstract: | Doubling is a simple but powerful method of constructing two-level fractional factorial designs with high resolution. This article studies uniformity in terms of Lee discrepancy of double designs. We give some linkages between the uniformity of double design and the aberration case of the original one under different criteria. Furthermore, some analytic linkages between the generalized wordlength pattern of double design and that of the original one are firstly provided here, which extend the existing findings. The lower bound of Lee discrepancy for double designs is also given. |
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Keywords: | Double Lee discrepancy uniformity 62K15 62K10 62K99 |
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