Detection of stress whitening in plastics with the help of X-ray dark field imaging |
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Authors: | Iwan Jerjen Vincent Revol Andreas J Brunner Philipp Schuetz Christian Kottler Rolf Kaufmann Thomas Luethi Giovanni Nicoletti Claus Urban Urs Sennhauser |
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Institution: | 1. Empa, Swiss Federal Laboratories for Materials Science and Technology, Ueberlandstrasse 129, CH-8600 Duebendorf, Switzerland;2. Microsystems Technology Division, Centre Suisse d''Electronique et Microtechnique SA, Technoparkstrasse 1, CH-8005 Zurich, Switzerland |
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Abstract: | The processing of thermoplastics can induce a wide range of defects such as stress whitening, cavitation and porosity, which can adversely affect the reliability of the final products. Hence, fast and effective non-destructive detection methods for such defects are highly important for quality assurance on production lines. In this paper, X-ray dark field imaging is presented as a new non-destructive testing method that allows the visualization of stress whitening or cavitation efficiently. The performance of the method is demonstrated for the case of an injection-moulded polyvinylidene fluoride part that exhibits stress whitening. Whereas the stress whitening could not be detected by conventional X-ray imaging, it was localized by an X-ray dark field image acquired within a few minutes. Once the precise location of the stress whitening was known, it was possible to verify the result by local micro X-ray computed tomography and by a micro section image. |
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Keywords: | X-ray dark field imaging X-ray differential phase contrast imaging Stress whitening Non-destructive testing of polymer parts |
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