High-resolution electron microscopy of microstructure of MnF<sub>2</sub> subjected to shock compression at 4.4 GPa期刊界 All Journals 搜尽天下杂志传播学术成果专业期刊搜索期刊信息化学术搜索

High-resolution electron microscopy of microstructure of MnF₂ subjected to shock compression at 4.4 GPa

Authors:	Kunio Yubuta Teruhisa Hongo Kazutaka G. Nakamura Masae Kikuchi

Affiliation:	^a Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan ^b Materials and Structures Laboratory, Tokyo Institute of Technology, Yokohama 226-8503, Japan ^c Kansei Fukushi Laboratory, Tohoku Fukushi University, Sendai 989-3201, Japan

Abstract:	Microstructure of MnF₂ subjected to by shock compression at 4.4 GPa was examined using transmission electron microscopy (TEM). Lamellar structure consisting of twin-related domains of rutile-structure and intergrowth of α- PbO₂-type phase is observed in the electron diffraction pattern and TEM images. The crystallographic relationship between rutile and α- PbO₂-type phases can be expressed as and .

Keywords:	61.50.Ks 61.16.Bg
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