Properties of sol-gel dip-coated zinc oxide thin films |
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| Authors: | K.R. Murali |
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| Affiliation: | Electrochemical Materials Science Division, Central Electrochemical Research Institute, Karaikudi 630 006, India |
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| Abstract: | Zinc oxide (ZnO) films were deposited on glass substrates by the sol-gel dip coating method using acrylamide route. The films were characterized by X-ray diffraction studies which indicated wurtzite structure. Optical absorption measurements indicated band gap in the range 3.17-3.32 eV. XPS studies indicated the formation of ZnO. The resistivity of the films were in the range 1000-10,000 ohm cm. |
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| Keywords: | A. Oxides A. Semiconductors A. Thin films B. Sol-gel growth |
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