Trace determination of boron,silicon and sulfur with oxygen-18 ion bombardment

In order to determine traces of boron, silicon and sulfur, B(¹⁸O, x)²⁷Mg, Si(¹⁸O, x)⁴³Sc and S(¹⁸O, x)⁴⁷V reactions have been investigated between 15 and 44MeV. At 34 MeV, only a few of the systematically identified nuclear interferences produce²⁷Mg and the detection limit is 30ng boron for a 10 minute irradiation with a 0.3μA·cm⁻² oxygen-18 beam. Silicon analysis has shown nuclear interferences from Al, P and K; interference-free detection limit is 80 ng silicon for an hour irradiation with a 0.4 μA·cm⁻² beam at 39 MeV. There is no nuclear interference for the sulfur determination and the detection limit is 5 ng sulfur for a 30 minutes irradiation with a 0.5 μA·cm⁻² beam at 39 MeV. Thus a selective and sensitive sulfur determination can be achieved.