Repolarization studies in amorphous and polycrystalline silicon |
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| Authors: | A. Singh E. A. Davis F. L. Pratt S. F. J. Cox |
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| Affiliation: | (1) Department of Physics and Astronomy, Leicester University, LE1 7RH Leicester, UK;(2) Clarendon Laboratory, University of Oxford, OX1 3PU Oxford, UK;(3) Rutherford Appleton Laboratory, 0X11 OQX Chilton, Didcot, Oxon, UK |
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| Abstract: | ![]()
A procedure has been developed to extract qualitative and quantitative information on the muonium fractions, in particular the Mu* fraction, in polycrystalline and amorphous materials from their longitudinal field repolarization curves. Preliminary results for amorphous silicon suggests that both the Mu* and Mu* fractions here are generally lower than in crystalline silicon at temperatures below 200K, but the Mu* fraction may survive to room temperature in this disordered host. |
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