Dynamics of tip-substrate interactions in atomic force microscopy

Dynamical interactions between a scanning tip and a silicon substrate are investigated using molecular dynamics simulations of both the constant-height and constant-force scan modes. Localized temporary and permanent modifications of the substrate occur, depending on tip-substrate-strate separation and scan geometry. Implications for resolving structural and force characteristics in scanning tip spectroscopies, employing atomically sharp as well as large ordered of disordered tips are discussed.