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Microcalorimeter Detectors and Low Voltage SEM Microanalysis
Authors:Edward A Kenik  David C Joy  Del Redfern
Institution:(1) Metals and Ceramics Division, Oak Ridge National Laboratory, 37831-6064 Oak Ridge, TN, USA;(2) Electron Microscopy Facility, University of Tennessee, 37996-0840 Knoxville, TN, USA;(3) EDAX Inc., 07430 Mahwah, NJ, USA
Abstract:The development of the microcalorimeter energy-dispersive X-ray spectrometer (µ-cal EDS) offers a significant advancement in X-ray microanalysis, especially for electron beam instruments. The benefits are especially pronounced for low voltage (le5thinspkV) X-ray microanalysis in the field emission scanning electron microscope (FE-SEM) where the high energy resolution of the µ-cal EDS minimizes the peak overlaps among the myriad of K, L, M and N lines in the 0–5thinspkeV energy range. The availability of L- and M-shell X-ray lines for microanalysis somewhat offsets the absence of X-ray lines traditionally used above 5thinspkeV energy. The benefits and challenges of the µ-cal EDS will be discussed, including P/B ratio for characteristic X-rays, collection angle, count rate capability and the impact of polycapillary X-ray optics on microanalysis.
Keywords:: Energy-dispersive X-ray spectrometry  microcalorimeter  low voltage X-ray microanalysis  scanning electron microscopy  
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