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Well depths of XeF− and XeCl− from ion transport data |
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| Authors: | L.A. Viehland E.A. Mason |
| Affiliation: | Parks College of Saint Louis University, Cahokia, Illinois 62206, USA;Brown University, Providence, Rhode Island 02912, USA |
| Abstract: | Mobility and diffusion data for F? and Cl? ions in Xe gas at 300 K are used to test the well depths and the “width” of the XeF? well previously obtained by a fit to differential scattering cross sections. |
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