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| 激光显微光谱法测定ITO导电膜中的Sn | |
| 引用本文： | 郭庆林 杨志平. 激光显微光谱法测定ITO导电膜中的Sn[J]. 光谱学与光谱分析, 1993, 13(6): 57-60 |
| 作者姓名： | 郭庆林 杨志平 |
| 作者单位： | 河北大学物理系固体发光室,河北大学物理系固体发光室 071002 保定,071002 保定 |
| 摘 要： | 本文利用激光显微光谱,涂片法制备样品,采用“Ｓ－Ｍ”法对ＩＴＯ导电膜中Ｓｎ进行定量分析,结果比较满意。 |
| 关 键 词： | S－M法 ITO 导电膜 激光显微光谱 锡 |
DETERMINATION OF Sn IN THE ITO FILM BY LASER MICROSPECTRUM METHOD |
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| GUO Qinglin,YANY Zhiping. DETERMINATION OF Sn IN THE ITO FILM BY LASER MICROSPECTRUM METHOD[J]. Spectroscopy and Spectral Analysis, 1993, 13(6): 57-60 | |
| Authors: | GUO Qinglin YANY Zhiping |
| Affiliation: | GUO Qinglin,YANY Zhiping Department of physics,Hebei University,071002 Baoding |
| Abstract: | Determination of Sn in the ITO film with "S-M" method (method of absolute black densities of laser micro-spectrum vs the contents of elements for minerals chemical coposition) is obtained. Samples were made by smear method. The result is satisfactory. |
| Keywords: | S-M method ITO film |
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